Scanning Force Microscope Using a Common-path Optical Heterodyne Interferometer.
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Journal of the Japan Society for Precision Engineering
سال: 1993
ISSN: 1882-675X,0912-0289
DOI: 10.2493/jjspe.59.1853